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Because of the evolution of the reliability of electronic circuits toward very low failure rate, the statistical analyses through accelerated ageing experiments become too expensive. Today, a deterministic approach of the physics of failure is necessary to estimate the life duration of the circuits. As the ageing mechanisms are highly dependent on the circuit operating conditions, electrical simulation...
Because of the evolution of the reliability of electronic circuits toward very low failure rate, the statistical analyses through accelerated ageing experiments become too expensive. Today, a deterministic approach of the physics of failure is necessary to estimate the life duration of the circuits. As the ageing mechanisms are highly dependent on the circuit operating conditions, electrical simulation...