Search results for: G. Freeman
2011 International Reliability Physics Symposium > 5A.6.1 - 5A.6.6
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3256 - 3261
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3097 - 3105
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1914 - 1919
2007 IEEE International Electron Devices Meeting > 255 - 258
IEEE Electron Device Letters > 2007 > 28 > 6 > 520 - 522