Search results for: Y.-J. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 33.5.1 - 33.5.4
2015 IEEE International Electron Devices Meeting (IEDM) > 26.1.1 - 26.1.4
2014 IEEE International Electron Devices Meeting > 32.7.1 - 32.7.4
2014 IEEE International Electron Devices Meeting > 16.4.1 - 16.4.4
IEEE Transactions on Nuclear Science > 2014 > 61 > 1-2 > 323 - 327
2013 IEEE SENSORS > 1 - 4
2012 International Electron Devices Meeting > 23.3.1 - 23.3.4