Search results for: F.-K. Hsueh
2016 IEEE International Electron Devices Meeting (IEDM) > 33.5.1 - 33.5.4
2014 IEEE International Electron Devices Meeting > 32.7.1 - 32.7.4
2012 International Electron Devices Meeting > 23.3.1 - 23.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 33.5.1 - 33.5.4
2014 IEEE International Electron Devices Meeting > 32.7.1 - 32.7.4
2012 International Electron Devices Meeting > 23.3.1 - 23.3.4