Search results for: J.‐H. Lee
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.3.1 - 4C.3.5
IEEE Electron Device Letters > 2012 > 33 > 1 > 20 - 22
IEEE Electron Device Letters > 2011 > 32 > 9 > 1194 - 1196
2009 International Semiconductor Conference > 1 > 51 - 56