Search results for: Antonis Paschalis
Frontiers in Electronic Testing
IEEE Design & Test > 2015 > 32 > 2 > 17 - 28
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 12 > 1991 - 2004
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 4 > 786 - 790
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 2 > 357 - 361
IEEE Transactions on Dependable and Secure Computing > 2012 > 9 > 1 > 86 - 100
Journal of Electronic Testing > 2003 > 19 > 2 > 103-112