Search results for: Yu Wang
Journal of Electronics (China) > 2009 > 26 > 5 > 715-719
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2229 - 2237
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 416 - 425
Journal of Electronics (China) > 2009 > 26 > 5 > 715-719
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2229 - 2237
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 416 - 425