Search results for: JiChel Bea
IEEE Electron Device Letters > 2016 > 37 > 1 > 81 - 83
2014 IEEE International Reliability Physics Symposium > 3E.4.1 - 3E.4.6
2013 IEEE International Electron Devices Meeting > 7.2.1 - 7.2.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.4.1 - 2B.4.6
IEEE Electron Device Letters > 2011 > 32 > 7 > 940 - 942