Search results for: Vincent Goiffon
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4985 - 4991
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1161 - 1166
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 455 - 462
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 38 - 44
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 141 - 148
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 133 - 140
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 27 - 37
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 45 - 53
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 19 - 26
Solid-State Electronics > 2016 > 125 > C > 227-233
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2183 - 2192
IEEE Journal of the Electron Devices Society > 2016 > 4 > 2 > 99 - 108
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2956 - 2964
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1200 - 1207
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3290 - 3301
IEEE Journal of the Electron Devices Society > 2014 > 2 > 4 > 65 - 76
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3331 - 3340