Search results for: Steve Stoffels
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-2-1 - 4A-2-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-5-1 - 4A-5-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Electron Device Letters > 2016 > 37 > 3 > 310 - 313
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 997 - 1004
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Electron Device Letters > 2015 > 36 > 10 > 1001 - 1003
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2416 - 2422
physica status solidi (a) > 212 > 5 > 1122 - 1129
2015 IEEE International Reliability Physics Symposium > 6C.4.1 - 6C.4.6
Solid State Electronics > 2015 > 103 > Complete > 127-130
Microelectronics Reliability > 2014 > 54 > 9-10 > 2232-2236
physica status solidi c > 11 > 3‐4 > 862 - 865
physica status solidi c > 11 > 3‐4 > 906 - 910