Search results for: Marleen Van Hove
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Electron Device Letters > 2017 > 38 > 7 > 918 - 921
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-5.1 - 4B-5.5
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
Microelectronics Reliability > 2016 > 64 > C > 547-551
physica status solidi c > 13 > 5‐6 > 311 - 316
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-2-1 - 4A-2-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 997 - 1004
Microelectronics Reliability > 2016 > 58 > C > 151-157
2015 IEEE International Electron Devices Meeting (IEDM) > 33.6.1 - 33.6.4
IEEE Electron Device Letters > 2015 > 36 > 10 > 1001 - 1003
physica status solidi (a) > 212 > 5 > 1122 - 1129
2015 IEEE International Reliability Physics Symposium > 6C.4.1 - 6C.4.6
Solid State Electronics > 2015 > 103 > Complete > 127-130
Microelectronics Reliability > 2014 > 54 > 9-10 > 2232-2236