Search results for: Matteo Meneghini
Microelectronics Reliability > 2016 > 64 > C > 547-551
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2334 - 2339
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
IEEE Electron Device Letters > 2016 > 37 > 5 > 611 - 614
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 767 - 775
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2830 - 2836