Search results for: J. Mitard
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-2-1 - XT-2-6
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
2013 IEEE International Electron Devices Meeting > 20.4.1 - 20.4.4
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4