Search results for: Guido Groeseneken
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 408 - 412
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 52 - 56
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 182 - 193
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 2 > 280 - 285
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1307 - 1315
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3081 - 3089
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 801 - 805
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 666 - 673
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 707 - 715
IEEE Electron Device Letters > 2014 > 35 > 2 > 160 - 162
IEEE Electron Device Letters > 2014 > 35 > 2 > 199 - 201
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111
2013 IEEE International Electron Devices Meeting > 10.1.1 - 10.1.4
Microprocessors and Microsystems > 2013 > 37 > 8 Part A > 792-800
2013 5th IEEE International Memory Workshop > 155 - 158
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213