Search results for: Geert Hellings
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-3.1 - 3F-3.6
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3424 - 3431
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-5-1 - 3B-5-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-4-1 - 4B-4-6
Microelectronics Reliability > 2016 > 57 > C > 53-58
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 3985 - 3990
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111