Search results for: Boyang Du
Microelectronics Reliability > 2017 > 76-77 > C > 58-63
Journal of Systems Architecture > 2017 > 75 > C > 95-106
IET Control Theory & Applications > 2017 > 11 > 5 > 647 - 667
IEEE Transactions on Computers > 2016 > 65 > 6 > 1846 - 1855