Search results for: Yung-Yu Chen
Microelectronics Reliability > 2012 > 52 > 6 > 995-998
Advanced Materials > 24 > 20 > 2722 - 2727
Advanced Materials > 24 > 20 > 2721 - 2721
Journal of Elasticity > 2012 > 106 > 2 > 149-164
2011 IEEE International Ultrasonics Symposium > 2487 - 2490
Microelectronic Engineering > 2011 > 88 > 6 > 945-949
Wave Motion > 2011 > 48 > 1 > 39-61
Microelectronic Engineering > 2010 > 87 > 11 > 2241-2246
IEEE Electron Device Letters > 2010 > 31 > 11 > 1178 - 1180
IEEE Electron Device Letters > 2010 > 31 > 12 > 1446 - 1448
Microelectronic Engineering > 2010 > 87 > 1 > 62-66
2009 IEEE Sensors > 1065 - 1068