Search results for: S. Barraud
Microelectronics Reliability > 2016 > 63 > C > 1-10
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 182 - 185
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 136 - 137
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 781 - 786
Solid-State Electronics > 2016 > 115 > PB > 167-172
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 365 > PB > 631-635
Microelectronic Engineering > 2015 > 147 > C > 10-14
Solid State Electronics > 2015 > 112 > Complete > 78-84