Search results for: H. Kino
2016 IEEE International Reliability Physics Symposium (IRPS) > 6B-1-1 - 6B-1-6
2011 International Electron Devices Meeting > 6.6.1 - 6.6.4
IEEE Transactions on Nanotechnology > 2011 > 10 > 3 > 528 - 531
2010 International Electron Devices Meeting > 2.3.1 - 2.3.4