Search results for: Johnny K. O. Sin
IEEE Electron Device Letters > 2017 > 38 > 5 > 689
IEEE Electron Device Letters > 2017 > 38 > 4 > 501 - 504
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 713 - 719
IEEE Electron Device Letters > 2017 > 38 > 3 > 356 - 358
IEEE Electron Device Letters > 2016 > 37 > 12 > 1555 - 1558
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4542 - 4545
IEEE Electron Device Letters > 2016 > 37 > 4 > 471 - 473
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 38 - 42
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 760 - 766
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2555 - 2561
IEEE Electron Device Letters > 2015 > 36 > 6 > 591 - 593
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 123 - 126
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 220 - 223
IEEE Electron Device Letters > 2014 > 35 > 1 > 108 - 110
IEEE Electron Device Letters > 2014 > 35 > 12 > 1287 - 1289