Search results for: J. F. Zhang
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7
2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 20.4.1 - 20.4.4
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2013 IEEE International Electron Devices Meeting > 31.3.1 - 31.3.4
2013 IEEE International Electron Devices Meeting > 15.6.1 - 15.6.4
IEEE Electron Device Letters > 2012 > 33 > 4 > 480 - 482
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341