Search results for: Johan De Baets
Microelectronics Reliability > 2017 > 74 > C > 131-135
Applied Surface Science > 2010 > 256 > 21 > 6269-6278
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 12-1 > 3842 - 3849
Applied Surface Science > 2009 > 255 > 21 > 8780-8787
Applied Surface Science > 2006 > 252 > 23 > 8243-8250
Applied Surface Science > 2006 > 252 > 8 > 2717-2740
Microelectronics Reliability > 2005 > 45 > 3-4 > 675-687
Applied Surface Science > 2003 > 208-209 > Complete > 171-176