Search results for: E Simoen
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Radiation Effects > 221-226
Solid State Electronics > 2014 > 101 > Complete > 131-136
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.4.1 - 5D.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
Thin Solid Films > 2012 > 520 > 8 > 3337-3340
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2674 - 2681
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2966 - 2973
Microelectronic Engineering > 2011 > 88 > 7 > 1243-1246
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769