Search results for: Juin J Liou
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
IEEE Electron Device Letters > 2013 > 34 > 12 > 1491 - 1493
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
IEEE Electron Device Letters > 2010 > 31 > 8 > 845 - 847