Search results for: Srivatsan Parthasarathy
Microelectronics Reliability > 2017 > 79 > C > 201-205
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
2015 IEEE International Reliability Physics Symposium > EL.3.1 - EL.3.5
2014 IEEE International Reliability Physics Symposium > 4C.3.1 - 4C.3.4
2014 IEEE International Reliability Physics Symposium > 4C.4.1 - 4C.4.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1061 - 1067
Microelectronics Reliability > 2014 > 54 > 1 > 57-63
IEEE Electron Device Letters > 2013 > 34 > 2 > 178 - 180
EOS/ESD Symposium Proceedings > 1 - 8
IEEE Electron Device Letters > 2010 > 31 > 7 > 665 - 667
IEEE Electron Device Letters > 2010 > 31 > 5 > 425 - 427
Materials Today > 2006 > 9 > 6 > 20-25