Search results for: J A del Alamo
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 468 - 474
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1020 - 1026
2015 IEEE International Electron Devices Meeting (IEDM) > 31.3.1 - 31.3.4
2014 IEEE International Electron Devices Meeting > 25.2.1 - 25.2.4
2013 IEEE International Electron Devices Meeting > 2.1.1 - 2.1.4
2013 IEEE International Electron Devices Meeting > 6.2.1 - 6.2.4
2012 International Electron Devices Meeting > 32.3.1 - 32.3.4
2012 International Electron Devices Meeting > 32.1.1 - 32.1.4
2011 International Reliability Physics Symposium > 4E.3.1 - 4E.3.4
Electronics Letters > 2011 > 47 > 6 > 406 - 407
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 132 - 140
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1963 - 1971
2010 International Electron Devices Meeting > 30.6.1 - 30.6.4