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Due to the proliferation of nanometer CMOS mixed-signal/RF circuits and a push towards high operating speeds (5–100 Ghz+), there has been renewed interest in the design of high-speed circuits and systems that can self-calibrate and self-heal post-manufacture and in the field. In the past, designers have invented self-healing mechanisms that are tailored towards specific (critical) mixed-signal/RF...
A low cost methodology for simultaneous testing and tuning of multiple chains of MIMO-OFDM wireless transmitter for system-level specifications is presented. Bandwidth-partitioned test stimuli enable the determination of the behavioral characteristics of the different chains of the RF transmitter using a one-time data acquisition. The determined behavioral characteristics of the transmitters are then...
A methodology to predict the process e-test parameters corresponding to each die (even in regions of the die where e-test structures are not available) from die test measurements for analog/RF systems is developed. The methodology provides diagnosis of process variations with higher spatial resolution in volume manufacturing over other techniques due to the availability of manufacturing test data...
In this paper, we present a low-cost methodology for parallel testing of MIMO-OFDM RF modules using optimized bandwidth-partitioned frequency domain stimulus applied from the embedded DSP module of the MIMO-OFDM system and a simple combination of sensors on the load board. A comprehensive set of specifications of multiple RF modules chains are computed simultaneously from the observed DUT response...
Due to the use of scaled technologies, high levels of integration and high speeds of today's mixed-signal SoCs, the problem of validating correct operation of the SoC under electrical bugs and that of debugging yield loss due to unmodeled multi-dimensional variability effects is extremely challenging. Precise simulation of all electrical aspects of the design including the interfaces between digital...
In this paper, a novel built-in tuning technique to compensate for variability induced imperfections in RF subsystems is proposed. The test stimulus is obtained from a filtered digital pattern and the RF response is down-converted using an envelope detector. The resulting signal is mapped to a digital signature, such that the Hamming Distance between the observed and the golden signature represents...
Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude...
Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune...
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