Search results for: J.R. Shih
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-3-1 - DI-3-5
2014 IEEE International Reliability Physics Symposium > 2D.6.1 - 2D.6.5
2014 IEEE International Reliability Physics Symposium > XT.3.1 - XT.3.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.4.1 - 3B.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 5F.3.1 - 5F.3.6
Solid State Electronics > 2010 > 54 > 7 > 728-731
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3203 - 3206
IEEE Electron Device Letters > 2008 > 29 > 8 > 938 - 940