Search results for: O. Gluschenkov
2016 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-1-1 - 4B-1-5
2011 International Electron Devices Meeting > 25.3.1 - 25.3.4
Journal of Crystal Growth > 1997 > 182 > 3-4 > 241-246