Search results for: V.A. Vashchenko
Russian Geology and Geophysics > 2012 > 53 > 2 > 175-184
2009 31st EOS/ESD Symposium > 1 - 8
Journal of Electrostatics > 2006 > 64 > 2 > 104-111
Microelectronics Reliability > 2005 > 45 > 3-4 > 457-471
Russian Geology and Geophysics > 2012 > 53 > 2 > 175-184
2009 31st EOS/ESD Symposium > 1 - 8
Journal of Electrostatics > 2006 > 64 > 2 > 104-111
Microelectronics Reliability > 2005 > 45 > 3-4 > 457-471