Search results for: Ming-Dou Ker
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 549 - 555
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3177 - 3184
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 156 - 162
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3625 - 3631
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3500 - 3507
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118