Search results for: F. Monsieur
Microelectronics Reliability > 2017 > 76-77 > C > 227-232
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-4-1 - 5A-4-6
2014 IEEE International Reliability Physics Symposium > XT.12.1 - XT.12.5
Journal of Computational Electronics > 2013 > 12 > 4 > 675-684
2012 International Electron Devices Meeting > 3.6.1 - 3.6.4
2011 International Electron Devices Meeting > 18.4.1 - 18.4.4