Search results for: C. Duvvury
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2607-2613
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 309 - 317
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 318 - 326
2009 31st EOS/ESD Symposium > 1 - 7
2009 31st EOS/ESD Symposium > 1 - 5
2009 31st EOS/ESD Symposium > 1 - 8
2009 31st EOS/ESD Symposium > 1 - 10
2009 31st EOS/ESD Symposium > 1 - 8