Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2449 - 2454
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 531 - 536
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3193 - 3198
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 156 - 162
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 242 - 249