Search results for: L. Larcher
2015 IEEE International Reliability Physics Symposium > 2E.6.1 - 2E.6.5
2013 5th IEEE International Memory Workshop > 116 - 119
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.2.1 - 5E.2.6
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2878 - 2887