Search results for: A. Calderoni
2016 IEEE International Electron Devices Meeting (IEDM) > 16.8.1 - 16.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.6.1 - 7.6.4
2015 IEEE International Reliability Physics Symposium > 5B.3.1 - 5B.3.6
2014 IEEE International Electron Devices Meeting > 14.3.1 - 14.3.4
2013 IEEE International Electron Devices Meeting > 31.5.1 - 31.5.4
IEEE Electron Device Letters > 2012 > 33 > 9 > 1267 - 1269
IEEE Electron Device Letters > 2008 > 29 > 10 > 1152 - 1154
Microelectronic Engineering > 2007 > 84 > 9-10 > 1998-2001