Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 642 - 645
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3177 - 3184
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 156 - 162
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3500 - 3507
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1011 - 1018
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561