Search results for: J. Sune
Microelectronics Reliability > 2014 > 54 > 9-10 > 1707-1711
Microelectronic Engineering > 2013 > 109 > Complete > 322-325
Microelectronics Reliability > 2013 > 53 > 9-11 > 1346-1350
Microelectronics Reliability > 2013 > 53 > 9-11 > 1257-1260
Thin Solid Films > 2013 > 533 > Complete > 38-42
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
2013 Spanish Conference on Electron Devices > 257 - 260
Microelectronics Reliability > 2012 > 52 > 9-10 > 1909-1912
Solid State Electronics > 2012 > 71 > Complete > 48-52
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.5.1 - GD.5.6
Thin Solid Films > 2012 > 520 > 7 > 2956-2959
IEEE Electron Device Letters > 2012 > 33 > 10 > 1474 - 1476
Microelectronic Engineering > 2011 > 88 > 7 > 1380-1383
2011 International Reliability Physics Symposium > 2A.1.1 - 2A.1.6