Search results for: X. Chen
Microelectronics Reliability > 2016 > 64 > C > 225-229
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 9 - 12
IEEE Electron Device Letters > 2013 > 34 > 4 > 508 - 510
2012 International Electron Devices Meeting > 20.6.1 - 20.6.4
Physics Procedia > 2012 > 32 > Complete > 885-890
IEEE Electron Device Letters > 2011 > 32 > 11 > 1495 - 1497
Chemistry – A European Journal > 16 > 34 > 10462 - 10473
2010 35th IEEE Photovoltaic Specialists Conference > 3565 - 3569
Surface Science > 2008 > 602 > 2 > 620-629