Search results for: Suk-Jin Ham
Microelectronics Reliability > 2010 > 50 > 4 > 507-513
IEEE Transactions on Advanced Packaging > 2010 > 33 > 1 > 64 - 71
Microelectronics Reliability > 2006 > 46 > 2-4 > 589-599
Microelectronics Reliability > 2010 > 50 > 4 > 507-513
IEEE Transactions on Advanced Packaging > 2010 > 33 > 1 > 64 - 71
Microelectronics Reliability > 2006 > 46 > 2-4 > 589-599