Search results for: Xiaoyan Liu
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 434 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1053 - 1059
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 246 - 252
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 947 - 954
IEEE Transactions on Nanotechnology > 2014 > 13 > 3 > 584 - 588
IEEE Transactions on Nanotechnology > 2011 > 10 > 2 > 244 - 249