Search results for: Daniel F. Baldwin
Microelectronics Reliability > 2016 > 65 > C > 217-224
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 11 > 1856 - 1863
Microelectronics Reliability > 2000 > 40 > 7 > 1181-1190
IEEE Transactions on Components, Packaging, and Manufacturing Technology:... > 1998 > 21 > 4 > 325 - 335
Biomaterials > 1996 > 17 > 14 > 1417-1422