Search results for: T. Poiroux
2016 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3605 - 3612
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2751 - 2759
2014 IEEE International Electron Devices Meeting > 7.2.1 - 7.2.4
2014 IEEE International Reliability Physics Symposium > PI.1.1 - PI.1.6
2013 IEEE International Electron Devices Meeting > 26.4.1 - 26.4.4
2013 IEEE International Electron Devices Meeting > 12.4.1 - 12.4.4
2013 IEEE International Electron Devices Meeting > 20.3.1 - 20.3.4
2012 International Electron Devices Meeting > 8.7.1 - 8.7.4
2012 International Electron Devices Meeting > 28.1.1 - 28.1.4
2012 International Electron Devices Meeting > 19.4.1 - 19.4.4