Search results for: T.-P. Lee
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
The Bell System Technical Journal > 1975 > 54 > 1 > 53 - 68
The Bell System Technical Journal > 1967 > 46 > 9 > 1977 - 2018
The Bell System Technical Journal > 1969 > 48 > 1 > 143 - 161
The Bell System Technical Journal > 1980 > 59 > 8 > 1365 - 1382
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3197 - 3203
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
2012 International Electron Devices Meeting > 32.3.1 - 32.3.4
IEEE Electron Device Letters > 2007 > 28 > 2 > 164 - 167
IEEE Electron Device Letters > 2007 > 28 > 6 > 482 - 485
Journal of Loss Prevention in the Process Industries > 2003 > 16 > 3 > 173-186