Search results for: N. Guitard
Microelectronics Reliability > 2012 > 52 > 9-10 > 1998-2004
Microelectronics Reliability > 2007 > 47 > 9-11 > 1456-1461
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 617 - 624
Microelectronics Reliability > 2006 > 46 > 9-11 > 1563-1568
Microelectronics Reliability > 2005 > 45 > 9-11 > 1415-1420
Microelectronics Reliability > 2003 > 43 > 1 > 71-79