Search results for: F. Zhang
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7
2016 IEEE International Electron Devices Meeting (IEDM) > 31.4.1 - 31.4.4
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 221 - 226
Journal of the European Ceramic Society > 2015 > 35 > 2 > 741-750
Journal of the European Ceramic Society > 2014 > 34 > 10 > 2453-2463
2013 IEEE International Electron Devices Meeting > 22.5.1 - 22.5.4
2013 IEEE International Electron Devices Meeting > 31.3.1 - 31.3.4
2013 IEEE International Electron Devices Meeting > 15.6.1 - 15.6.4
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2505 - 2511
IEEE Electron Device Letters > 2012 > 33 > 4 > 480 - 482
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 5 > 1723 - 1731
Polish Journal of Chemistry > 2009 > Vol. 83, nr 11 > 2009-2019
IEEE Electron Device Letters > 2007 > 28 > 4 > 298 - 300