Search results for: Yu Lin
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2824 - 2829
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 11 > 2723 - 2732
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
2012 IEEE Sensors > 1 - 4
2012 IEEE International Reliability Physics Symposium (IRPS) > EL.3.1 - EL.3.5
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561