Search results for: X. Chen
2015 IEEE International Reliability Physics Symposium > MY.2.1 - MY.2.4
Electronics Letters > 2009 > 45 > 11 > 530 - 532
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. > S. Cohen - L. Deligianni
Electronics Letters > 1993 > 29 > 12 > 1106 - 1107
IEE Proceedings E - Computers and Digital Techniques > 1988 > 135 > 5 > 266 - 272