Search results for: Chao Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-7.1 - PM-7.4
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 2 > 315 - 324
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
2010 International Electron Devices Meeting > 5.5.1 - 5.5.4
IEEE Transactions on Semiconductor Manufacturing > 2010 > 23 > 3 > 391 - 399
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 416 - 425