Search results for: Wei-Ting Kary Chien
Journal of Failure Analysis and Prevention > 2018 > 18 > 6 > 1490-1502
Microelectronics Reliability > 2017 > 72 > C > 1-4
Microelectronics Reliability > 2016 > 64 > C > 185-188
Microelectronics Reliability > 2016 > 64 > C > 220-224
IEEE Transactions on Reliability > 2015 > 64 > 4 > 1158 - 1163